data sheet doc. no : qw0905-L9SEF4843-PF rev : a date : 12 - apr. - 2007 super bright cylindrical type led lamps L9SEF4843-PF pb lead-free parts ligitek electronics co.,ltd. property of ligitek only
25.0min directivity radiation note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. 75% -60 100% 60 100% 50%0 25%50% 25%75% 30 0 -30 + - 1.0min 2.54typ package dimensions part no. L9SEF4843-PF page 1/5 3.0 0.5 typ 3.8 1.0 1.5max 3.8 ligitek electronics co.,ltd. property of ligitek only
electrostatic discharge( * ) operating temperature typical electrical & optical characteristics (ta=25 ) note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. L9SEF4843-PF part no algainp material storage temperature reverse current @5v dominant wave length dnm luminous intensity @20ma(mcd) viewing angle 2 1/2 (deg) spectral halfwidth nm forward voltage @20ma(v) color water clear orange emitted lens 17 2.6 max. 1.7 min. 90 min. 120 160 typ. 2000 -40 ~ +100 -40 ~ +85 tstg esd t opr ir10 v a absolute maximum ratings at ta=25 forward current power dissipation peak forward current duty 1/10@10khz parameter 9sef ratings ligitek electronics co.,ltd. property of ligitek only i fp pd i f symbol 60 75 30 ma mw ma unit page 2/5 static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. * 605 part no. L9SEF4843-PF
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( ) r e l a t i v e i n t e n s i t y @ 2 0 m a wavelength (nm) f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 fig.4 relative intensity vs. temperature ambient temperature( ) r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 forward voltage(v) fig.1 forward current vs. forward voltage f o r w a r d c u r r e n t ( m a ) forward current(ma) fig.2 relative intensity vs. forward current r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0101001000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40-200204060 1.0 1.1 1.2 550 600 650 0.0 0.5 1.0 2.03.04.05.0 80100 0.8 0.9 -20 -40 40 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 500 typical electro-optical characteristics curve 9sef chip page 3/5 part no. L9SEF4843-PF
dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5 c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) note:1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. 0 0 60 seconds max 50 preheat 25 120 2 /sec max time(sec) 150 100 260 c3sec max 260 temp( c) 5 /sec max page 4/5 soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350 c max soldering time:3 seconds max(one time only) distance:2mm min(from solder joint to body) 2.wave soldering profile ligitek electronics co.,ltd. property of ligitek only part no. L9SEF4843-PF
the purpose of this test is the resistance of the device under tropical for hours. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. this test intended to see soldering well performed or not. 1.t.sol=260 5 2.dwell time= 10 1sec. solder resistance test 1.t.sol=230 5 2.dwell time=5 1sec solderability test 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles thermal shock test 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs high temperature high humidity test mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202:103b jis c 7021: b-11 description the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. ligitek electronics co.,ltd. property of ligitek only 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) high temperature storage test 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) low temperature storage test operating life test reliability test: test condition test item page 5/5 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 mil-std-883:1008 jis c 7021: b-10 jis c 7021: b-12 reference standard part no. L9SEF4843-PF
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